Welcome to the MU Electron Microscope Facility

The Electron Microscope Facility in Millersville University (MU) is devoted to materials testing. We have a Hitachi SU3900 Scanning Electron Microscope (SEM) with multiple detectors: secondary electron (SE), backscattered secondary electon (BSE), ultra variable-pressure detector UVD, and energy dispersive spectrocopy (EDS) Ultim Max 40 X-ray System from Oxford Instruments. We also maintain supporting equipment and tools to facilitate materials preparation and testing. The supporting equipment include: a Gold (Au) sputter coater,  a Carbon (C) coater, a Zeiss optical microscope and a carbon dioxide critical point dryer. All equipment are available for use by faculty, students, researchers, other academic institutions, and industry. 

Acknowledgments: Acquisition of the Hitachi SU 3900 SEM was supported by the National Science Foundation, NSF-MRI - Award# 1919729